Studies of scanning-probe-microscopy tip-induced anodic oxidation on the nickel thin-film
碩士 === 國立東華大學 === 應用物理研究所 === 94 === In order to analyze capacitance forces between the tip and the nickel film or the tip-induced nickel oxide layer, the scanning probe microscopy (SPM) and the scanning capacitance force microscopy (SCFM) were operated under varying gaps and various applied voltage...
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67991803814287334494 |