Investigation of novel dual work function metal gate technologies

博士 === 國立交通大學 === 電子工程系所 === 94 === Two novel dual work function metal gate technologies are investigated and proposed. With the down-scaling of the device geometry for performance improvement, inherent drawbacks of conventional polysilicon gate electrodes lead to increasingly significant negative i...

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Bibliographic Details
Main Authors: Tzung-Lin Li, 李宗霖
Other Authors: Chun-Yen Chang
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/54541603074669381461