Study on Reliability of Low-Temperature Polycrystalline Silicon Thin Film Transistors under Dynamic Stress

碩士 === 國立交通大學 === 光電工程系所 === 94 === The low temperature polycrystalline silicon (poly-Si) thin film transistors (TFTs) have become the main technology and are applied for active matrix liquid crystal display (AMLCD), organic light emitting diode, and driving circuits. Recently, the low temperature...

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Bibliographic Details
Main Author: 李逸哲
Other Authors: Po-Tsun Liu
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/03068525068253463206