Sifting Rules of Virtual-Metrology Independent Variables
碩士 === 國立成功大學 === 製造工程研究所碩博士班 === 94 === Incorrectness, fragment and asynchrony of collected data may lead to inaccurate virtual metrology results. To improve virtual metrology accuracy, data preprocess is extremely essential. Data preprocess deals with the processes of data examination and sifting....
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/88032353670641849970 |