Software-Based Test Methodology for Fully Associative Data Cache
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 94 === The testing problem of caches in a processor may be addressed using the built-in self-test (BIST) or design-for-test (DFT) techniques. However, the insertion of test circuits required by these techniques would adversely affect the performance of the cache. Hen...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/05938144834249030372 |