Hot-Carrier Induced Degradation of p-channel High Voltage Double-Diffused-Drain (DDD) MOSFET
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 94 === In this thesis, the device characteristics and hot-carrier induced degradation of p-channel High-voltage (HV) Double-Diffused-Drain (DDD) MOSFETs are investigated. The effect of three different parameter conditions on DDD PMOSFETs discussed in my thesis,...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40281418009953272454 |