Automatic Defect Inspection and Enhancement for Patterned TFT-LCD Panel Surfaces
碩士 === 國立成功大學 === 資訊工程學系碩博士班 === 94 === We present a inspection system for patterned TFT-LCD panel surface. In addition, we also present a technique for defect classification. There are two major parts in our framework, image acquisition and image processing. What type of camera we have decided is L...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2006
|
Online Access: | http://ndltd.ncl.edu.tw/handle/21805343060183460301 |