Automatic Defect Inspection and Enhancement for Patterned TFT-LCD Panel Surfaces

碩士 === 國立成功大學 === 資訊工程學系碩博士班 === 94 === We present a inspection system for patterned TFT-LCD panel surface. In addition, we also present a technique for defect classification. There are two major parts in our framework, image acquisition and image processing. What type of camera we have decided is L...

Full description

Bibliographic Details
Main Authors: Ying-Da Li, 李英達
Other Authors: Jenn-Jier Lien
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/21805343060183460301