Electrical characterization of the well-aligned ZnO nanorods by impedance spectroscopy

碩士 === 國立成功大學 === 化學工程學系碩博士班 === 94 ===   AC impedance analysis has been employed to investigate the carrier concertations of the well-aligned ZnO nanorods on p++-Si. Indium contacts were deposited on the ZnO nanorod surfaces and p++-Si backside to form the ohmic contacts. Elements, such as junction...

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Bibliographic Details
Main Authors: Kwan-Pang Wong, 黃鯤鵬
Other Authors: Jih-Jen Wu
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/60793810818834796337