Using a new microtensile system to measure the mechanical properties of sub-micron thick thin film materials
碩士 === 國立中興大學 === 精密工程學系所 === 94 === In this research, we present a novel designed microtensile test apparatus that is capable of measuring the mechanical properties of free-standing thin film materials. We also develop a new fabrication method using the electroplating technique to fabricate the spr...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28079581942338753514 |