Recognition of TFT-LCD Defects by Image Processing Techniques and Neural Network Paradigms
碩士 === 華梵大學 === 工業工程與經營資訊學系碩士班 === 94 === The purpose of this research is to apply image processing technology and neural network to the defective detection of array panel. Firstly, two-dimensional Fourier transform and inverse Fourier transform are utilized and then let defects be even conspicuous...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/11336326221381789890 |