Apply Basysian classification and factor analysis to process error predictions and diagnoses in semi-conductor production

碩士 === 中華大學 === 科技管理學系(所) === 94 ===

Bibliographic Details
Main Authors: Wei Shuo HUANG, 黃偉碩
Other Authors: 張丁才
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/03148142362109426325