Generation of Control Patterns for Switching Activity Reduction during Scan Testing
碩士 === 元智大學 === 資訊工程學系 === 93 === This thesis considers the power consumption of full-scan circuits during test application. The proposed approach is based on the generation of control patterns generator for full-scan circuit. The control patterns are then applied to the primary inputs of the CUT du...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27850447086729966336 |