The electrical mechanisms of the dielectrics prepared by the anodization to fabricate HfO2 and HfON at room temperature
碩士 === 國立雲林科技大學 === 電子與資訊工程研究所 === 93 === This experiment is planned to utilize sputtering method to deposit ultrathin metal Hf or HfN in silicon basis, then, utilize anodization to make metal layer change into hafnium oxide (HfO2) and hafnium oxynitride (HfON) at room temperature. Whether the param...
Main Authors: | Kai-Te Wnag, 王凱德 |
---|---|
Other Authors: | Hseih-Tao Chou |
Format: | Others |
Language: | zh-TW |
Published: |
2005
|
Online Access: | http://ndltd.ncl.edu.tw/handle/02211725871506093913 |
Similar Items
-
Growth and characterization of HfON thin films with the crystal structures of HfO2
by: Lü, Bo
Published: (2011) -
Charge-Trapping Characteristics of Non-volatile Memory Using HfON Trapping Layer and HfO2/SiO2 Barriers
by: Fu, Wei-Huan, et al.
Published: (2013) -
Study on the Reliability of HfO2 and HfSiON Gate Dielectric
by: 林威良
Published: (2008) -
Characteristics of Stacked HfON and HfZrO2 Ferroelectric Films and Its Application on Junctionless FET
by: LIN, TAI-YIN, et al.
Published: (2019) -
Degradation and Recovery of HfO2/ZrO2/HfO2 Dielectric Layer
by: Shun-Ping Sung, et al.
Published: (2017)