Design and Development of Sub-micron Non-contact Diamond Tool Profile Monitoring System

碩士 === 淡江大學 === 機械與機電工程學系碩士班 === 93 === Error of the tool profile is an important factor which affects the precision in ultra-precision diamond turning operation. Traditionally, the measure method of the tool profile is used LVDT directly to contact and detect the tool profile. But the precision of...

Full description

Bibliographic Details
Main Authors: Shing-Kuang Chen, 陳星光
Other Authors: Choung-Lii Chao
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/22930853371391611528