Studies of Chemical Copper Plating and Kinetics behavior
碩士 === 國立臺北科技大學 === 化學工程所 === 93 === We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope an...
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ndltd-TW-093TIT050630102019-05-30T03:49:57Z http://ndltd.ncl.edu.tw/handle/75vh34 Studies of Chemical Copper Plating and Kinetics behavior 不同基材的化學鍍銅研究及其動力學探討 Tseng-Hsien Wu 吳宗憲 碩士 國立臺北科技大學 化學工程所 93 We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope and Scanning Electron Microscope(SEM) observe surface structure with diffetent concentration of additive. Also we use four-point probe to discuss variation of surface resistance. Estimate effect of its electromagnetic interference shielding Effectiveness (EMISE) by surface resistance. Using X-ray Powder Diffractometer ; XRPD to discuss the structure of plated copper. We use Atomic Absorption spectrometer (AA) to determine variation of concentration of plating bath. During plating procedure, we use ultrasound agitation to see its effect to electroless copper plating and to derive kinetics equations. Jun-Shang Chang 張俊賢 2005 學位論文 ; thesis 83 zh-TW |
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碩士 === 國立臺北科技大學 === 化學工程所 === 93 === We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope and Scanning Electron Microscope(SEM) observe surface structure with diffetent concentration of additive. Also we use four-point probe to discuss variation of surface resistance. Estimate effect of its electromagnetic interference shielding Effectiveness (EMISE) by surface resistance. Using X-ray Powder Diffractometer ; XRPD to discuss the structure of plated copper.
We use Atomic Absorption spectrometer (AA) to determine variation of concentration of plating bath. During plating procedure, we use ultrasound agitation to see its effect to electroless copper plating and to derive kinetics equations.
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Jun-Shang Chang |
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Jun-Shang Chang Tseng-Hsien Wu 吳宗憲 |
author |
Tseng-Hsien Wu 吳宗憲 |
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Tseng-Hsien Wu 吳宗憲 Studies of Chemical Copper Plating and Kinetics behavior |
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Tseng-Hsien Wu |
title |
Studies of Chemical Copper Plating and Kinetics behavior |
title_short |
Studies of Chemical Copper Plating and Kinetics behavior |
title_full |
Studies of Chemical Copper Plating and Kinetics behavior |
title_fullStr |
Studies of Chemical Copper Plating and Kinetics behavior |
title_full_unstemmed |
Studies of Chemical Copper Plating and Kinetics behavior |
title_sort |
studies of chemical copper plating and kinetics behavior |
publishDate |
2005 |
url |
http://ndltd.ncl.edu.tw/handle/75vh34 |
work_keys_str_mv |
AT tsenghsienwu studiesofchemicalcopperplatingandkineticsbehavior AT wúzōngxiàn studiesofchemicalcopperplatingandkineticsbehavior AT tsenghsienwu bùtóngjīcáidehuàxuédùtóngyánjiūjíqídònglìxuétàntǎo AT wúzōngxiàn bùtóngjīcáidehuàxuédùtóngyánjiūjíqídònglìxuétàntǎo |
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