Studies of Chemical Copper Plating and Kinetics behavior

碩士 === 國立臺北科技大學 === 化學工程所 === 93 === We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope an...

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Main Authors: Tseng-Hsien Wu, 吳宗憲
Other Authors: Jun-Shang Chang
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/75vh34
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spelling ndltd-TW-093TIT050630102019-05-30T03:49:57Z http://ndltd.ncl.edu.tw/handle/75vh34 Studies of Chemical Copper Plating and Kinetics behavior 不同基材的化學鍍銅研究及其動力學探討 Tseng-Hsien Wu 吳宗憲 碩士 國立臺北科技大學 化學工程所 93 We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope and Scanning Electron Microscope(SEM) observe surface structure with diffetent concentration of additive. Also we use four-point probe to discuss variation of surface resistance. Estimate effect of its electromagnetic interference shielding Effectiveness (EMISE) by surface resistance. Using X-ray Powder Diffractometer ; XRPD to discuss the structure of plated copper. We use Atomic Absorption spectrometer (AA) to determine variation of concentration of plating bath. During plating procedure, we use ultrasound agitation to see its effect to electroless copper plating and to derive kinetics equations. Jun-Shang Chang 張俊賢 2005 學位論文 ; thesis 83 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立臺北科技大學 === 化學工程所 === 93 === We investigate electroless copper plating on poly ethylene terephthalate(PET) fabric, sheet, and other substrates. Discuss the effects of different operating conditions to deposition rate and morphology change on defferent substrates. We use optical microscope and Scanning Electron Microscope(SEM) observe surface structure with diffetent concentration of additive. Also we use four-point probe to discuss variation of surface resistance. Estimate effect of its electromagnetic interference shielding Effectiveness (EMISE) by surface resistance. Using X-ray Powder Diffractometer ; XRPD to discuss the structure of plated copper. We use Atomic Absorption spectrometer (AA) to determine variation of concentration of plating bath. During plating procedure, we use ultrasound agitation to see its effect to electroless copper plating and to derive kinetics equations.
author2 Jun-Shang Chang
author_facet Jun-Shang Chang
Tseng-Hsien Wu
吳宗憲
author Tseng-Hsien Wu
吳宗憲
spellingShingle Tseng-Hsien Wu
吳宗憲
Studies of Chemical Copper Plating and Kinetics behavior
author_sort Tseng-Hsien Wu
title Studies of Chemical Copper Plating and Kinetics behavior
title_short Studies of Chemical Copper Plating and Kinetics behavior
title_full Studies of Chemical Copper Plating and Kinetics behavior
title_fullStr Studies of Chemical Copper Plating and Kinetics behavior
title_full_unstemmed Studies of Chemical Copper Plating and Kinetics behavior
title_sort studies of chemical copper plating and kinetics behavior
publishDate 2005
url http://ndltd.ncl.edu.tw/handle/75vh34
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