Dynamic Simulation and Vibration Analysis of the Atomic Force Microscope by Finite Element Method

碩士 === 國立臺灣科技大學 === 機械工程系 === 93 === The purpose of this study is to derive the equations of motion and to investigate the vibrations of the atomic force microscope (AFM), which includes the contact mode and noncontact mode. At first, the equations of motion of the AFM micro cantilever including the...

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Bibliographic Details
Main Authors: Wu-chih Chen, 陳武志
Other Authors: C.-L. Liao
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/35014149684667234337