Measurement and development of a bipolar electrostatic chuck in serial plasma processes

碩士 === 國立臺灣大學 === 應用力學研究所 === 93 === The bipolar electrostatic chuck for silicon wafers has been developed for used in serial plasma process. The advantage of the bipolar electrostatic chuck is that attractions appear without plasma, so we take advantage of it in industry gradually. The bipolar elec...

Full description

Bibliographic Details
Main Authors: Chih-lung lin, 林志龍
Other Authors: Jaw-Yen Yang
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/88747552626760984230