Defect Influence of Magnetization Reversal in Magnetic Thin Film

碩士 === 國立臺灣大學 === 物理研究所 === 93 === The spin of the electron has attracted renewed interest recently, because it promises a wide variety of new devices that combine logic, storage and sensor applications. But in the real world, numeric kinds of defects are always forming and existing while device fab...

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Bibliographic Details
Main Authors: William Liu, 劉逸尊
Other Authors: Ching-Ray Chang
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/44935079885378763498