Characterization of the Liquid Crystal Display (LCD) Alignment Layer Grown by an Oblique Evaporation Method
碩士 === 國立臺灣海洋大學 === 電機工程學系 === 93 === Abstract The objective of this thesis is to investigate the physical properties of silicon dioxide (SiO2) thin film as conditioned by different deposition angle, thickness, the temperature on the substrate and IAD (Ion-beam Assisted Deposition). In this study,...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/18316583339191532549 |