A Satisfiability-Based Auto Test Pattern Generation for Path Delay Faults
碩士 === 國立清華大學 === 電機工程學系 === 93 === We develop a automatic test pattern generator (ATPG) for stuck-at faults, transition faults and path delay faults. Our ATPG is based on a SAT engine. The SAT engine has efficient implementation of justification and implication. Our stuck-at fault ATPG uses the pat...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/93227715437975876136 |