Accurate Interconnect Capacitance Modeling for Microloading Effect in Nanometer Technologies
碩士 === 國立清華大學 === 資訊工程學系 === 93 === The foundry provides not only the design rules but also resistances and capacitances of the mainstream test structures of interconnect for designers in the process of the back-end of line of VLSI. These capacitances and resistances affect the design of circuits an...
Main Author: | 黃俊富 |
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Other Authors: | 張克正 |
Format: | Others |
Language: | zh-TW |
Published: |
2005
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Online Access: | http://ndltd.ncl.edu.tw/handle/96345009254599726328 |
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