Develop A Yield Enhancement Framework based on Main Branch Decision Tree Algorithm for Mining Semiconductor Data – An Empirical Study of A DRAM Fab

碩士 === 國立清華大學 === 工業工程與工程管理學系 === 93 === In order to response the production promoting, cost-reducing and quality-improving in semiconductor industry, engineers need effective analytical method to deal with relevant data analysis and decision problem. While making trouble shooting in semiconductor...

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Bibliographic Details
Main Authors: Yen-Chung, Lai, 賴彥中
Other Authors: Chen-Fu, Chien
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/07724467986754420245