Investigation of ESD Protection Devices in High-speed Digital System

碩士 === 國立中山大學 === 通訊工程研究所 === 93 === In the trends of high clock rate, lower voltage, small volume, and portable requirement for present electric products, the noise immunity of high speed digital circuit becomes a critical factor for system designer. ESD problem becomes more and more important for...

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Bibliographic Details
Main Authors: Yi-Lun Jan, 詹奕倫
Other Authors: Tzong-Lin Wu
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/87315823281225181571