Statistical Study on Temperature Dependence of Low Temperature Polycrystalline Silicon Thin Film Transistor
碩士 === 國立交通大學 === 光電工程系所 === 93 === LTPS TFTs suffer from serious device characteristic variation due to the number of defects of the polysilicon film. This thesis studies on temperature effect of low temperature poly-silicon thin film transistor (LTPS TFT) with a statistical method. We first establ...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/58306219935736194026 |