The study of a linear dichroism and retarder combined system by Multi-wavelength Photoelastic Modulated ellipsometry
碩士 === 國立交通大學 === 光電工程系所 === 93 === The Photoelastic Modulation Ellipsometer is used to measure an artificial circular polarizer (CP), which is a combination of a linear polarizer and a retarder. The multi-wavelength measurement technique is built up by using the Kr-Ar tunable laser. In the beginni...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/68221772101912764225 |