Built-in Self Test for jitter measurement

碩士 === 國立成功大學 === 電機工程學系碩博士班 === 93 ===  Phase-locked loops (PLLs) are often served as clock generators and/or frequency synthesizers in a system on a chip (SoC). Since it is usually built inside the chip deeply, it is hard to test PLL directly by using automatic test equipments (ATEs). For a clock...

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Bibliographic Details
Main Authors: Ann-Shen Zhao, 趙安生
Other Authors: Soon-Jyh Chang
Format: Others
Language:en_US
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/30296290427134359925