A 10-bit 500M-sample/sec Digital to Analog Converter

碩士 === 國立成功大學 === 電機工程學系碩博士班 === 93 ===  In this paper, a 10-bit 500-MSample/s CMOS digital-to-analog (D/A) converter is presented. It is based on a current steering segmented 5 + 5 architecture that comprises 5MSB’s unary cells and 5LSB’s binary weighted cells in this design.  The 500-MSample/s con...

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Main Authors: Kuan-Hung Chou, 周冠宏
Other Authors: Ching-Chun Wang
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/82184302127011166824
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spelling ndltd-TW-093NCKU54421162017-06-10T04:46:28Z http://ndltd.ncl.edu.tw/handle/82184302127011166824 A 10-bit 500M-sample/sec Digital to Analog Converter 十位元每秒500百萬次取樣速率數位類比轉換器 Kuan-Hung Chou 周冠宏 碩士 國立成功大學 電機工程學系碩博士班 93  In this paper, a 10-bit 500-MSample/s CMOS digital-to-analog (D/A) converter is presented. It is based on a current steering segmented 5 + 5 architecture that comprises 5MSB’s unary cells and 5LSB’s binary weighted cells in this design.  The 500-MSample/s conversion rate has been obtained by an, at transistor level, fully custom designed thermometer decoder and synchronization circuit. In the digital part, a high speed, high output crossing-point latch is designed to minimize the glitch energy. Moreover, using cascade current cell in analog part can increase the output impedance and improve the performance of the SNDR and SFDR.  From the simulation result, the glitch energy is 0.995 psec-V. For a near 250 MHz input signal at 500 MHz sampling rate, the SNDR is about 60dB. The power consumption of this DAC with a single 3.3V supply is 70 mW. Proper area of current source transistor is chosen to overcome mismatch error due to process variation. This DAC chip is fabricated using TSMC 0.18μm-1P6M CMOS process and the die area is 1.07mm×1.07mm. Ching-Chun Wang 王俊智 2005 學位論文 ; thesis 87 zh-TW
collection NDLTD
language zh-TW
format Others
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description 碩士 === 國立成功大學 === 電機工程學系碩博士班 === 93 ===  In this paper, a 10-bit 500-MSample/s CMOS digital-to-analog (D/A) converter is presented. It is based on a current steering segmented 5 + 5 architecture that comprises 5MSB’s unary cells and 5LSB’s binary weighted cells in this design.  The 500-MSample/s conversion rate has been obtained by an, at transistor level, fully custom designed thermometer decoder and synchronization circuit. In the digital part, a high speed, high output crossing-point latch is designed to minimize the glitch energy. Moreover, using cascade current cell in analog part can increase the output impedance and improve the performance of the SNDR and SFDR.  From the simulation result, the glitch energy is 0.995 psec-V. For a near 250 MHz input signal at 500 MHz sampling rate, the SNDR is about 60dB. The power consumption of this DAC with a single 3.3V supply is 70 mW. Proper area of current source transistor is chosen to overcome mismatch error due to process variation. This DAC chip is fabricated using TSMC 0.18μm-1P6M CMOS process and the die area is 1.07mm×1.07mm.
author2 Ching-Chun Wang
author_facet Ching-Chun Wang
Kuan-Hung Chou
周冠宏
author Kuan-Hung Chou
周冠宏
spellingShingle Kuan-Hung Chou
周冠宏
A 10-bit 500M-sample/sec Digital to Analog Converter
author_sort Kuan-Hung Chou
title A 10-bit 500M-sample/sec Digital to Analog Converter
title_short A 10-bit 500M-sample/sec Digital to Analog Converter
title_full A 10-bit 500M-sample/sec Digital to Analog Converter
title_fullStr A 10-bit 500M-sample/sec Digital to Analog Converter
title_full_unstemmed A 10-bit 500M-sample/sec Digital to Analog Converter
title_sort 10-bit 500m-sample/sec digital to analog converter
publishDate 2005
url http://ndltd.ncl.edu.tw/handle/82184302127011166824
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