A Low Cost Memory Built-in Self-Test Architecture and its Design Automation
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 93 === In this thesis, a low cost memory built-in self-test architecture called the LCBIST architecture which has the features of high speed, high fault coverage, low test power consumption, and low area overhead is proposed. A design automation tool called the LCB...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14806777607741455477 |