The Investigation on GaN Growth byEpitaxial Lateral Overgrowth
碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 93 === The optical performance of a GaN blue-light emitting diode is greatly influenced by the density and distribution of threading dislocations, which in turn strongly depend on the ratio of mask to window width during Epitaxial Lateral Overgrowth (ELOG). Thus...
Main Authors: | ching-i chang, 張靜宜 |
---|---|
Other Authors: | Chuan-Pu Liu |
Format: | Others |
Language: | zh-TW |
Published: |
2005
|
Online Access: | http://ndltd.ncl.edu.tw/handle/95774979747453593523 |
Similar Items
-
Optical Investigation of ZnO Nanorods and GaN Growth by Epitaxial Lateral Overgrowth
by: 姚秋蓮
Published: (2005) -
The Characteristic Study of Epitaxial Lateral Overgrowth GaN by MOCVD
by: Shih-Hsien Chuang, et al.
Published: (2000) -
CAFM Studies of Epitaxial Lateral Overgrowth GaN Films
by: Kasliwal, Vishal P.
Published: (2007) -
Investigation of GaN thin film by facet-controlled epitaxial lateral overgrowth method
by: Te-Fang Yang, et al. -
Self-organized propagation of dislocations in GaN films during epitaxial lateral overgrowth
by: Sakai, Akira, et al.
Published: (2000)