The Lower Confidence Limit on Process Capability Index SPK
碩士 === 國立勤益技術學院 === 工業工程與管理系 === 93 === Quality index, SPK, holding one-to-one mathematical relationship with the process yield, can not only evaluate the capability but also reflect the yield of a process. Because the distribution function of the estimator of index SPK is quite complex, it is diffi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/05921307478958158005 |