Current Mode Integrated Circuits Testing and Applications Based on Wilson Current Mirrors
碩士 === 崑山科技大學 === 電子工程研究所 === 93 === The IEEE Boundary Scan Standard 1149.1 has been widely used for digital circuit testing. But with the development of SoC, many chips include digital and analog circuits simultaneously. Therefore, in this thesis we propose current mode boundary scan mechanism to t...
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| Format: | Others |
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2005
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| Online Access: | http://ndltd.ncl.edu.tw/handle/87005980427282924900 |