Development of Dimension Inspection System for Carrier Tape

碩士 === 遠東技術學院 === 機械研究所 === 93 === In this paper, image processing is applied to build up a dimension inspection system for carrier-tape. A fast and simple technique is used for dimensional inspection of the carrier type. In order to improve the holes detection from the original image, two auxiliary...

Full description

Bibliographic Details
Main Authors: Wang Zheng-Wei, 王政暐
Other Authors: Yang Xi-Kai
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/18358862355550443244