Effects of the surface treatment on n-type GaN Schottky diodes

碩士 === 逢甲大學 === 電機工程所 === 93 === Abstract The relationship between the surface states related to nitrogen -vacancy defects and surface Fermi level pinning has been investigated using x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy and capacitance–voltage measurements. Barr...

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Bibliographic Details
Main Authors: CHING-YAO HO, 何靖堯
Other Authors: Yow-Jon Lin
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/65187138840311198194