The Worst-Case Accumulated Jitter Measurement for Phase-Locked Loops

碩士 === 國立清華大學 === 電機工程學系 === 92 === This paper presents a Time-to-Digital Converter (TDC) circuit to measure the worst-case accumulated jitters over N periods of the PLL output signal. The worst-case jitters that include the most positive jitter and the most negative jitter can be calculated through...

Full description

Bibliographic Details
Main Authors: Chih-Feng Li, 李志峰
Other Authors: Tsin-Yuan Chang
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/26208716863399403809