Flash Memory Built-In Self-Test with Enhanced Test Mode Control

碩士 === 國立清華大學 === 電機工程學系 === 92 === Flash memory is widely used in many applications nowadays. Theuse of commodity and embedded Flash memories are growing rapidly as the demand of 3C products increases, especially for the battery-powered devices and other low power devices. Flash memory can be progr...

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Bibliographic Details
Main Authors: Yan-Ting Lai, 賴彥廷
Other Authors: Prof. Cheng-Wen Wu
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/77457563318520647134