Molecular Dynamics Simulation of Sputtering of Copper Atoms Due to Argon Ion Bombardment

碩士 === 國立交通大學 === 機械工程系所 === 92 === Sputtering of copper metal targets (100) due to bombardment of a single argon ion at vacuum condition is simulated using molecular dynamic simulation. A simplified EAM (embedded atom model) is used to mimic Cu-Cu interaction, while ZBL model is used to model Cu-Ar...

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Bibliographic Details
Main Authors: Jiun-Shian Wu, 吳俊賢
Other Authors: 吳宗信
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/02948688899986234001