Surface state density profiles of GaN using C-V measurement
碩士 === 國立交通大學 === 電子物理系所 === 92 === Abstract This thesis is focused on profiling surface state density of GaN Schottky diode using capacitance-voltage measurement. It is known that if large quantity of surface states do exist on the GaN surface, the corresponding curve of the reciprocal square of th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/d5x933 |