Understanding of the Hot Carrier and NBTI Effects for Advanced CMOS Devices with SiON and N/O stack

碩士 === 國立交通大學 === 電子工程系所 === 92 ===

Bibliographic Details
Main Authors: Zi-Qiang Ku, 顧子強
Other Authors: Steve S. Chung
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/h6448h