Thin Film Preparation and Characterization of Carbon-based Dielectrics for ULSI Interconnect Technology

博士 === 國立交通大學 === 材料科學與工程系所 === 92 === The purpose of this work is research the dielectric properties of a-C and a-SiC:H films, deposited respectively by using gridless ion beam deposition (GIBD) and plasma-enhanced chemical vapour deposition (PECVD), to evaluate the possibility for using in the etc...

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Bibliographic Details
Main Authors: Yan-Way Li, 李延煒
Other Authors: 陳家富
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/569vwa