Characterization of Off-State Conduction Mechanisms of Schottky Devices

碩士 === 國立交通大學 === 電子工程系 === 92 === Recently, we fabricated and demonstrated new devices, called SB-TFT with FID (Field-Induced Drain) and SB-SOI FinFET with S/D extensions. These devices were used metallic silicide Schottky source/drain in lie of the highly doped S/D in the conventional M...

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Bibliographic Details
Main Authors: Da-Wei Lai, 賴大偉
Other Authors: Tiao-Yuan Huang
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/11301432252913806883