SILICON-CONTROLLED RECTIFIER WITH SUBSTRATE-TRIGGERED TECHNIQUE FOR ON-CHIP ESD PROTECTION IN CMOS INTEGRATED CIRCUITS

博士 === 國立交通大學 === 電子工程系 === 92 === With the highest electrostatic discharge (ESD) robustness in the smallest layout area, the silicon-controlled rectifier (SCR) device had been used in the on-chip ESD protection circuits for a long time among various ESD protection devices (such as the di...

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Bibliographic Details
Main Authors: Kuo-Chun Hsu, 徐國鈞
Other Authors: Ming-Dou Ker
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/45573088056305457482