Broad Band Lensless Ultrasonic Microscopy Measurement System for Material Characterization
碩士 === 國立成功大學 === 機械工程學系碩博士班 === 92 === In this thesis, a broad band lensless ultrasonic microscopy measurement system has been set up for material characterization. The measurement system utilizes tone burst signal for sound wave interfering measurement. The reflective signal is received by spect...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37810533801172448750 |