Lowpass Sigma-Delta Modulator Based Measurement Technique for ADCs
碩士 === 國立成功大學 === 電機工程學系碩博士班 === 92 === Due to the increasing complexity of electronic systems and the capabilities of deep sub-micron technologies, more and more system functionality has been integrated in a single chip (SoC) in recent years. Consequently there is an increasing number of chips that...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2004
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Online Access: | http://ndltd.ncl.edu.tw/handle/37586518781539453365 |