Lowpass Sigma-Delta Modulator Based Measurement Technique for ADCs

碩士 === 國立成功大學 === 電機工程學系碩博士班 === 92 === Due to the increasing complexity of electronic systems and the capabilities of deep sub-micron technologies, more and more system functionality has been integrated in a single chip (SoC) in recent years. Consequently there is an increasing number of chips that...

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Bibliographic Details
Main Authors: Shiue-Cheng Jeng, 鄭學誠
Other Authors: Ming-Der Shieh
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/37586518781539453365