Fault Detection And Diagnosis Methodology For Embedded FPGA's
碩士 === 輔仁大學 === 電子工程學系 === 92 === In recent years, advances in VLSI technology have greatly increased the degree of circuit integration. Moreover, the rapid development in packaging technology has also reduced the controllability and observability in internal nodes of integrated circuits....
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/50745868803581863686 |