Advanced Image-Spectrum Technique: The Investigation of Dielectric Property and Thermal Stability of Low-k Material in Cu Metallization
博士 === 國立清華大學 === 工程與系統科學系 === 91 === In this thesis, we developed an advanced microscopy technique:image-spectrum technique to study the dielectric property and thermal stability of Black DiamondTM dielectric materials for copper metallization. In my dissertation, I used newly developed...
Main Authors: | Shen-Chuan Lo, 羅聖全 |
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Other Authors: | Ji-Jung Kai |
Format: | Others |
Language: | zh-TW |
Published: |
2003
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Online Access: | http://ndltd.ncl.edu.tw/handle/47224646887139034119 |
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