Advanced Image-Spectrum Technique: The Investigation of Dielectric Property and Thermal Stability of Low-k Material in Cu Metallization

博士 === 國立清華大學 === 工程與系統科學系 === 91 === In this thesis, we developed an advanced microscopy technique:image-spectrum technique to study the dielectric property and thermal stability of Black DiamondTM dielectric materials for copper metallization. In my dissertation, I used newly developed...

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Bibliographic Details
Main Authors: Shen-Chuan Lo, 羅聖全
Other Authors: Ji-Jung Kai
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/47224646887139034119