Studies on Hot-Carrier effects in High-Voltage Lateral-Diffused MOSFETs
博士 === 國立清華大學 === 電子工程研究所 === 91 === In this thesis, we present a new reverse transconductance method to investigate hot-carrier degradation on high-voltage (HV) lateral-diffused metal-oxide-semiconductor field-effect transistors (LDMOSFETs). This new method can extract asymmetric drain and source s...
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| Format: | Others |
| Language: | en_US |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95723175179307785343 |