Test Vehicle Design Methodology for Integrated Circuit Process Development and Control Monitoring

博士 === 國立清華大學 === 電子工程研究所 === 91 === As product requirement moves from digital microprocessors and application-specific integrated circuits (ASICs) to system-on-a-chip (SOC), process encounters complex functionality integration, more heterogeneous systems, and the challenges of providing a diverse r...

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Bibliographic Details
Main Authors: Kelvin Yih-Yuh Doong, 董易諭
Other Authors: Charles Ching-Hsiang Hsu
Format: Others
Language:en_US
Published: 2002
Online Access:http://ndltd.ncl.edu.tw/handle/74069439031362240928