The Development of an Infrared-based Time-activity Pattern Monitoring System for Exposure Assessment
碩士 === 國立中央大學 === 環境工程研究所 === 91 === The Enhanced Workplace Assessment System (called TEWAS) has been developed for time-activity pattern survey among workers. TEWAS consists with three subsystems: the personal infrared emitter subsystem, the stationary infrared receiver subsystem and the data acqui...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/51492977272278381009 |