Forecasting Model of Post CMP Planarity with Pad Properties

碩士 === 國立交通大學 === 科技管理學程碩士班 === 91 === Selective oxide CMP methods like ILD and PMD CMP are commonly used in achieving global planarization for schemes of quarter micron processes and beyond. PMD & ILD CMP process offers great advantages in processing devices with better global planar...

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Bibliographic Details
Main Authors: Chunta Chen, 陳俊達
Other Authors: Benjamin J.C. Yuan
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/70992642119388942625